NanoCalc VIS Setup

Name: Kapatek
Address: Werner-Gebhardt-Weg 11, Dietramszell, 83623, DE
Telephone: +49 (0) 8027 904211
Price range: $$

Specification:

Wavelength:400 - 850 nm
Thickness range:50 nm - 100 μm
Resolution:0,1 nm
Repeatability:0,3 nm
Angle of incidence:90°
Number of layers:up to 10
Refractive Index:yes
Filmthickness of:transparent or semitransparent materials
Reference needed:yes, bare substrat
Measurement mode:Reflection and Transmission
Rough materials:yes
Measurement speed:100ms to 1s
On-Line possibilities:yes
working distance(hight):
1,5-3mm, up to 50mm with collimation (COL-UV-6.35)
Spot size:
Standard: 200μm or 400μm, optional 100μm on request
Microspot:yes, in combination with mikroscope
Mapping option:yes, on request
Connection to PC:USB 2
Number of spectrometers1 or 2
Specification

FFT analyze with enhanced mathematics Thickness of a SU8 layer, thickness is 11.8 μm.

Windows 10, Windows 7	32 bit
Adaption to smaller monitors	no
User interface: result and Notepad chart	.
Recipe management by function keys; F1, F2 etc.	No
Fast buttons	No
Change font sizes International languages (French, German etc.)	No
Data for extended wavelength: from 200 nm – 2500 nm	No
Sliders for thickness and N&K values	No
Automatic curve scaling	No
Adjustable extraction bar	No
FFT analysis , enhanced mathematics	No

Windows 10, Windows 7	64 bit
Adaption to smaller monitors	Yes
User interface: result and Notepad chart	Notepad with export to Excel
Recipe management by function keys; F1, F2 etc.	Yes
Fast buttons	Yes
Change font sizes International languages (French, German etc.)	Yes
Data for extended wavelength: from 200 nm – 2500 nm	Yes
Sliders for thickness and N&K values	Yes
Automatic curve scaling	Yes
Adjustable extraction bar	Yes
FFT analysis , enhanced mathematics	Yes