KaPatek is a manufacturer of optical Thin Film Measurement Systems based on the measuring principle of spectroscopic reflectometry.
For more than 25 years we have been dealing with optical thin film thickness measurement systems for measuring optical properties and the thickness of transparent and semitransparent layers and offer our customers complete solutions for quality control in R&D and in production. The spectroscopic reflectometry thin film measurement system is a very fast, non-destructive and highly precise measuring method, suitable for ex and in-situ applications.
With our NanoCalc reflectometr measuring systems we meet all these criteria and offer our customers easy-to-use, highly accurate and very affordable measuring tools for metrology applications.
The software is delivered via a storage medium or via download.
The NanoCalc full version only works in conjunction with an Ocean Insight spectrometer such as Falme-T, Maya Pro, NIRQuest etc.
However, you should use lenses with a sufficiently small aperture and magnification so that the conditions of perpendicular and parallel incidence of light are still guaranteed.